Trimek is one of the leading metrology systems and solutions provider. The company's technological background allow us to offer the most advanced solutions that meet our worldwide clients needs.
- Innovalia Metrology presents NanoCMM at EuroNanoForum 2009
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Dr. Oscar Lázaro from Innovalia Metrology presented the latest developments and results of the project NanoCMM: Universal and Flexible Coordinate Metrology for Micro and Nano Components Production, at the international conference EuroNanoForum 2009, held in Prague on 2-5 June 2009.
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- Trimek builds a set of machines for Renault
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Trimek has finished the development of systems to the production plants in Asia and South America. Renault visited Innovalia Metrology to see one of the machines of the set of big systems for the production plants in South America and Asia.
On the photo, representatives of Innovalia Metrology and Renault are in front of the Land Duplex which will be part of the installations of Renault.
- Innovalia Metrology presents innovative at the Control Fair
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On 5, 6, 7 and 8 May, Innovalia Metrology participated in the 23rd Control Fair in Sttutgart, Germany, the only world fair focused exclusively on quality assurance.
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Innovalia Metrology presented in Sttutgart the latest solutions to guarantee the quality in a cost-effective way for the automotive, railway, Aeolian and aeronautic industry, among others.
- Metromeet closes successfully the 5th edition
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Metromeet, the International Conference on Industrial Dimensional Metrology, held a very successful 5th edition in Bilbao, Spain. Metromeet has had more than 120 delegates from all over the world; Argentina, USA, United Kingdom, Holland, Germany, Russia, Spain, Italy, Thailand. Our guests could enjoy two tutorials, four keynotes and 25 presentations divided into 7 tracks.
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- Nasa, NIST, Intel and many more at Metromeet
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The 5th edition of Metromeet, the International Conference on Industrial Dimensional Metrology that held in Bilbao, Spain, on 26 and 27 March, have had speakers like Meyya Meyyapan from the NASA and Bill Rippey, from NIST.
The conference consisted of four keynotes, two tutorials and 19 presentatiosn. The latest developments of areas like nanometrology, calibrations and standards, 3D optical technologies were presented.
- Scheduled courses Innovalia Metrology
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Innovalia Metrology presents the calendar of Metrology Courses for 2009; Metrology Advanced Courses, Introduction to optical digitalized systems and metrology virtual 3D, Course of Dimensional and Geometric Tolerances, Machine Verification Methods and I++ Seminars.
In addition, customized training courses will allow companies to choose from a wide range of possibilities: Measurement, Calibration, Optical Measurement, Measurement Software, etc.
Click here to see the schedule of Innovalia Metrology courses
Trimek Quality
Events
Trimek is preseting its solutions and services in the following metrology related meetings:
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