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Innovalia Metrology at CIMES

The 9th International Exhibition of China Machine Tool (CIMES), has become an important platform in the field of metrology in the Chinese market. Therefore, from the 9th until the 13th of October, Innovalia Metrology will attend this biannual fair held in Beijing since 1992, which brings together the most international important signatures. At the Innovalia Metrology booth, attendees are able to see the latest developments in non- contact technology applied on the CMM Vulkan system. This system runs measurement programs at high speed from metrology standardized software, and gets the maximum performance out of the optical sensor “Optiscan”.

The 9th International Exhibition of China Machine Tool (CIMES), has become an important platform in the field of metrology in the Chinese market. Therefore, from the 9th until the 13th of October, Innovalia Metrology will attend this biannual fair held in Beijing since 1992, which brings together the most international important signatures. At the Innovalia Metrology booth, attendees are able to see the latest developments in non- contact technology applied on the CMM Vulkan system. This system runs measurement programs at high speed from metrology standardized software, and gets the maximum performance out of the optical sensor “Optiscan”.

Innovalia Metrology provides high added value in exclusive and proprietary technology in the Chinese market, one of the most competitive in the world.